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MCEM Facilities

MCEM currently supports four transmission electron microscopes, three scanning electron microscopes, a dual beam focussed ion beam (FIB) microscope and two three-dimensional atom probes, as well as a broad range of instrumentation for sample preparation and image analysis. Two new field-emission gun TEMs, one with probe and image Cs corrector, a FEG-SEM with EBSD, and a dual beam/FIB have been installed during 2008.

Transmission Electron Microscopes

Double-corrected FEI Titan3 80-300 FEGTEM (2008) 300kV, FEG-TEM/STEM, Super-Twin pole piece; CEOS Cs probe corrector; CEOS Cs image corrector; Fischione Instruments 3000 annular dark field detector, on-axis BF/DF detector; EDAX 30 mm2 retractable Si(Li) X-ray detector and analyser; Gatan Tridium 863 P image filter; Gatan UltraScan 1000 P (2kx2k) CCD camera, high stability tomography goniometer, Gatan 636 Double tilt cooling holder, Gatan HCHTR3000 Double tilt He holder, Fischione Instruments 2020 ultra-high tilt tomography holder, Fischione Instruments 2040 Dual-axis advanced tomography holder, Fischione Instruments 2050 on-axis rotation tomography holder
JEOL JEM 2100F FEGTEM (2008) 200 kV; FEG; TEM/STEM high resolution pole piece; piezo stage; oil free pumping system; Gatan UltraScan 1000 (2kx2k) CCD camera; Gatan 692 Retractable TV camera; Gatan BF/ADF STEM detectors; JEOL BF/HAADF STEM detectors; Gatan 776 Enfina 1000 parallel detection EELS spectrometer; Gatan 777 STEM Pack; Gatan Diffraction Image;  JEOL 50 mm2 Si(Li) EDX detector; Gatan EDX DigitalMicrograph plug-in; Gatan tomography software; Fischione Instruments 2030 Ultra-narrow gap advanced tomography holder; Gatan 655 turbo pumping station.
Philips CM20 TEM (1992) 200kV; LaB6; scanning unit; TWIN pole piece, Oxford Instruments Si(Li) X-ray detector with ultra-thin window (UTW) and Oxford INCAEnergyTEM software, Gatan 831 SC600 Orius™ CCD camera (2.7kx2.7k), Gatan 805 BF/DF STEM system.
JEOL JEM 2011 TEM (2000) 200kV; LaB6; high resolution objective lens pole piece; Oxford Instruments Si(Li) X-ray detector with UTW and Inca X-ray analysis system; Gatan 622 SC TV camera; Gatan 894 UltraScan 1000 CCD camera (2kx2k); Gatan TV camera; Gatan 901 hot stage to 1000°C; Gatan 900 liquid N2 stage; Gatan 655 turbo pumping station.

Scanning Electron Microscopes

JEOL JSM 7001F FEGSEM (2008) FEG; 5-axis stage; IR camera; retractable BE detector; turbo-molecular pump; Bruker 10 mm2 Si drift detector and analysis system; HKL electron backscattered diffraction (EBSD) system.
JEOL JSM-840A SEM (1986) JEOL JSM-840A SEM (1986)W filament; Oxford Instruments Si(Li) X-ray detector with UTW and Oxford INCA X-ray analysis and imaging system.
JEOL JSM 6300F FEGSEM (1991)

Cold FEG; Noran HPGe X-ray detector with UTW and WinEDS X-ray analysis and imaging system.

Focussed Ion Beam Microscope

FEI Quanta 3D FEG (2008) FEG; FIB; Pt GIS; ESEM; 5-axis stage; IR camera; low-vacuum & gaseous SE detectors; BSE detector; retractable STEM detector; oil-free vacuum system; cryo-can; EDAX Pegasus XM4 X-ray analysis system with 40mm2 Si drift detector and Hikari EBSD system. Kleindiek in-situ and ex-situ lift out systems.

3D Atom Probe Field Ion Microscopes

Kindbrisk 3D APFIM (2000) Kindbrisk 3D Atom Probe Field Ion Microscope
Oxford NanoScience 3D APFIM (2003) Oxford NanoScience 3D Atom Probe Field Ion Microscope

Other Equipment

Other equipment includes:

  • Specimen preparation equipment, software and dark rooms
  • Reichert FCS Cryo-microtome
  • Reichert Ultracut E microtome
  • Olympus SZX-16 Stereo Zoom Optical microscope
  • Olympus BX-51 Metallurgical microscope with 12M pixel CCD camera
  • Struers Tenupol 2, 3, 5 Twin Jet Electro-Polishers
  • Atom Probe Tip Polisher (in-house)
  • Cressington 208HR Sputter Coater
  • Dynavac Evaporative Coater
  • Dynavac SC150 Sputter Coater
  • Gatan 691 Precision Ion Polishing System (PIPS), two systems
  • Gatan 682 Precision Etching and Coating System (PECS) and Perpendicular Slope
    Cutting Tool
  • Gatan 950 Solarus Advanced Plasma System
  • Gatan 656 Dimple Grinder
  • Gatan 601 Ultrasonic Disc Cutter
  • Struers Accutom 50 Precision Saw
  • Buehler Isomet low speed saw
  • Buehler Handimet wet grinding station
  • Gentle Mill ion miller
  • Darkroom Facilities
  • Image Plate Reader (Ditabis Micron),
  • Precision Wire Saw, Model: WS22, and
  • Computer room and various software packages.